College of Engineering, All Events
Sunday, October 15, 2017
Monday, October 16, 2017
Tuesday, October 17, 2017
Wednesday, October 18, 2017
Thursday, October 19, 2017
Focused ion beam (FIB) can have significant advantages over electron beam lithography (EBL), like direct, resistless, 3D patterning, and patterning on 3D. Raith has advanced both dedicated EBL and FIB instrumentation over the last 15 years to meet the special requirements of nanofabrication.
Friday, October 20, 2017
Recent advancement in Atomic Force Microscopy (AFM) techniques enable evaluation of material's nanoscale-level opto-electrical, mechanical, chemical and acousto-thermo properties beyond conventional topography measurements. Scanning Microwave Impedance Microscopy (SMIM) combined with Conductive-AFM, and Photo-Thermal Induced Resonance (PTIR) techniques will be presented.
A few of Scott’s close friends and colleagues will share how his contributions to science, AFM, and outreach enriched their lives. Please come celebrate Scott’s life and work and to remember his demeanor and dedication. A reception will follow in the second floor hallway of the Materials Research Laboratory.